July 2017, Honolulu, Hawaii, USA
In Conjunction with the Conference on Computer Vision and Pattern Recognition - CVPR 2017
Organizers

  • Laura Leal-Taixe, Technical University of Munich, Germany
  • Luis Patino, University of Reading, United Kingdom
  • Anton Milan, University of Adelaide, Australia
  • Tom Cane, BMT Group Ltd., United Kingdom
  • Ian Reid, University of Adelaide, Australia
  • Daniel Cremers, Technical University of Munich, Germany
  • James L. Crowley, INRIA Rhone-Alpes, France
  • Stefan Roth, Technische Universität Darmstadt, Germany
  • Konrad Schindler, ETH Zürich, Switzerland
  • James Ferryman, University of Reading, United Kingdom

Program Committee
  • Alexandre Alahi, Stanford, USA
  • Mykhaylo Andriluka, Standford, USA
  • Horesh Ben-Shitrit, Second Spectrum Inc., Switzerland
  • Wongun Choi, NEC Laboratories America, USA
  • Robert Collins, Pennsylvania State University, USA
  • Anthony Dick, University of Adelaide, Australia
  • Haroon Idrees, University of Central Florida, USA
  • Wenhan Luo, Imperial College London
  • Radu Timofte, ETH Zurich, Switzerland
  • Hamid Rezatofighi, University of Adelaide, Australia
  • Bodo Rosenhahn, Leibniz University Hannover, Germany
  • Siyu Tang, MPI Informatics, Saarbrücken, Germany
  • Xinchao Wang, UIUC, USA
  • Bo Yang, Samsung Information Systems America, USA
  • Ju Hong Yoon, Korea Electronics Technology Institute (KETI)
  • Shouu-I Yu, Carnegie Mellon University, USA
  • Klamer Schutte TNO, Netherlands
  • Francois Bremond, INRIA, France
  • Gerard Sanroma, University of North Carolina at Chapel Hill, US
  • Carlo Regazzoni, University of Genova, Italy
  • Terry Boult, University of Colorado, US
  • Davig Hogg, University of Leeds, UK
  • James Orwell, Kingston University, UK
  • Jorgen Ahlberg, TST, Sweden
  • Genevieve Sella, SAGEM, France
  • Karl-Goran Stenborg, Swedish Defence Research Agency, Sweden
  • Paco Gomez, Visual Tools, Spain
  • Ratnesh Kumar, Placemeter, USA
  • Ram Nevatia, University of Southern California, USA
  • Ko Nishino, Drexel University, USA
  • Bo Yang, Samsung IS America, USA
  • Ivan Laptev, INRIA Paris, France
This workshop is part of


Participating institutions